TY  - DATA
TI  - IEEE Transactions on Device and Materials Reliability
SN  - 1530-4388
CY  - New York, USA
PB  - The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
KW  -  Components, Circuits, Devices and Systems
KW  -  Power, Energy and Industry Applications
KW  - Engineered Materials, Dielectrics and Plasmas
N1  - Subscribed through National Knowledge Resource Consortium (NKRC)
UR  - https://ieeexplore.ieee.org/servlet/opac?punumber=7298
ER  -