TY  - DATA
TI  - IEEE Photonics Journal
SN  - 1943-0655
CY  - New York, USA
PB  - The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
KW  -  Photonics and Electrooptics
KW  - Engineered Materials, Dielectrics and Plasmas
N1  - Subscribed through National Knowledge Resource Consortium (NKRC)
UR  - https://ieeexplore.ieee.org/servlet/opac?punumber=4563994
ER  -