00872nai a2200205Ia 4500003000900000008004100009022002200050022002300072040001600095245004800111260008600159310001400245362002900259521006900288650003600357856008800393942000700481999001700488952016100505IN-BaIIA211028c9999    xx      s     000 0 eng d  a0740-7475 (Print)  a1558-1918 (Online)  cIIA Library 0aIEEE Design & Test of Computersh[eJournal]  aNew York, USAbThe Institute of Electrical and Electronics Engineers, Inc. (IEEE)  aBimonthly  a1(1); 1984 - 29(6); 2012  bSubscribed through National Knowledge Resource Consortium (NKRC)  aComputing and Processing948785  uhttps://ieeexplore.ieee.org/servlet/opac?punumber=54yClick Here to Access eJournal  cEJ  c34495d34495  00104070aBANbBANd2009-01-01eNKRCh1(1); 1984 - 29(6); 2012l0pEJ579r2021-11-05uhttps://ieeexplore.ieee.org/servlet/opac?punumber=54w2021-11-05yEJ