TY  - DATA
TI  - IEEE Design & Test
SN  - 2168-2356
CY  - New York, USA
PB  - The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
KW  -  Components, Circuits, Devices and Systems
KW  - Computing and Processing
N1  - Subscribed through National Knowledge Resource Consortium (NKRC)
UR  - https://ieeexplore.ieee.org/servlet/opac?punumber=6221038
ER  -