IEEE Design & Test  [eJournal] 

 - New York, USA  The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 
 - Bimonthly 
 - 30(1); 2013 - Present 
<br/><br/> Subscribed through National Knowledge Resource Consortium (NKRC) 
<br/><br/><label>ISSN: </label>2168-2356 (Print) 2168-2364 (Online) 
<br/><br/><label>Subjects--Topical Terms: </label><br/> Components, Circuits, Devices and Systems<br/>Computing and Processing