TY  - BOOK
AU  - Rusch, Thomas, ed.
TI  - X-Rays in Materials Analysis: Novel Applications and Recent Developments
T2  - Proceedings of SPIE; V. 0690
SN  - 9780892527250 (Print)
PY  - 1986///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/0690
ER  -