00535nam a2200145Ia 4500003000900000008004100009020002600050040001600076100002300092245008600115260003200201300002000233490003300253856010300286IN-BaIIA211028s9999    xx      s     000 0 eng d  a9780892527250 (Print)  cIIA Library  aRusch, Thomas, ed. 0aX-Rays in Materials Analysis: Novel Applications and Recent Developmentsh[eBook]  aWashington, USAbSPIEc1986  aOnline resource  aProceedings of SPIE; V. 0690  uhttps://www.spiedigitallibrary.org/conference-proceedings-of-spie/0690yClick Here to Access eBook