TY  - BOOK
AU  - Lai, Barry, ed.
TI  - X-Ray Nanoimaging: Instruments and Methods II
T2  - Proceedings of SPIE; V. 9592
SN  - 9781628417586 (Print)
PY  - 2015///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/9592
ER  -