TY  - BOOK
AU  - McNulty, Ian, ed.
TI  - X-Ray Micro- and Nano-Focusing: Applications and Techniques II
T2  - Proceedings of SPIE; V. 4499
SN  - 9780819442130 (Print)
PY  - 2001///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/4499
ER  -