TY  - BOOK
AU  - Hau-Riege, Stefan, ed.
TI  - X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II
T2  - Proceedings of SPIE; V. 9210
SN  - 9781628412376 (Print)
PY  - 2014///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/9210
ER  -