TY  - BOOK
AU  - Alfano, Robert, ed.
TI  - Ultrafast Laser Probe Phenomena in Bulk and Microstructure Semiconductors III
T2  - Proceedings of SPIE; V. 1282
SN  - 9780819403339 (Print)
PY  - 1990///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/1282
ER  -