TY  - BOOK
AU  - Alfano, Robert, ed.
TI  - Ultrafast Laser Probe Phenomena in Bulk and Microstructure Semiconductors
T2  - Proceedings of SPIE; V. 0793
SN  - 9780892528288 (Print)
PY  - 1987///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/0793
ER  -