TY  - BOOK
AU  - Batchelor, Bruce, ed.
TI  - Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology
T2  - Proceedings of SPIE; V. 5265
SN  - 9780819451538 (Print)
PY  - 2004///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/5265
ER  -