TY  - BOOK
AU  - Wadekar, Shekhar, ed.
TI  - Tests, Measurements, and Characterization of Electro-Optic Devices and Systems
T2  - Proceedings of SPIE; V. 1180
SN  - 9780819402165 (Print)
PY  - 1990///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/1180
ER  -