00544nam a2200145Ia 4500003000900000008004100009020002600050040001600076100002600092245009200118260003200210300002000242490003300262856010300295IN-BaIIA211028s9999    xx      s     000 0 eng d  a9780819402165 (Print)  cIIA Library  aWadekar, Shekhar, ed. 0aTests, Measurements, and Characterization of Electro-Optic Devices and Systemsh[eBook]  aWashington, USAbSPIEc1990  aOnline resource  aProceedings of SPIE; V. 1180  uhttps://www.spiedigitallibrary.org/conference-proceedings-of-spie/1180yClick Here to Access eBook