TY  - BOOK
AU  - Wang, Shing-Chung, ed.
TI  - Testing, Reliability, and Applications of Optoelectronic Devices
T2  - Proceedings of SPIE; V. 4285
SN  - 9780819439635 (Print)
PY  - 2001///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/4285
ER  -