@book{33096,
	author = {Wang, Shing-Chung, ed.},
	title = {Testing, Reliability, and Applications of Optoelectronic Devices},
	publisher = {SPIE},
	year = {2001},
	series = {Proceedings of SPIE; V. 4285},
	address = {Washington, USA},
	url = {https://www.spiedigitallibrary.org/conference-proceedings-of-spie/4285}
}