Geer, Robert, ed. <br/><br/>
Testing, Reliability, and Application of Micro- and Nano-Material Systems IV  [eBook] 

 - Washington, USA  SPIE  2006 
 - Online resource 
 - Proceedings of SPIE; V. 6175 .
<br/><br/><label>ISBN: </label>9780819462282 (Print)