TY  - BOOK
AU  - Geer, Robert, ed.
TI  - Testing, Reliability, and Application of Micro- and Nano-Material Systems III
T2  - Proceedings of SPIE; V. 5766
SN  - 9780819457479 (Print)
PY  - 2005///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/5766
ER  -