Geer, Robert, ed. <br/><br/>
Testing, Reliability, and Application of Micro- and Nano-Material Systems III  [eBook] 

 - Washington, USA  SPIE  2005 
 - Online resource 
 - Proceedings of SPIE; V. 5766 .
<br/><br/><label>ISBN: </label>9780819457479 (Print)