TY  - BOOK
AU  - Meyendorf, Norbert, ed.
TI  - Testing, Reliability, and Application of Micro- and Nano-Material Systems
T2  - Proceedings of SPIE; V. 5045
SN  - 9780819448507 (Print)
PY  - 2003///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/5045
ER  -