TY  - BOOK
AU  - Chin, Aland, ed.
TI  - Test and Measurement Applications of Optoelectronic Devices
T2  - Proceedings of SPIE; V. 4648
SN  - 9780819443878 (Print)
PY  - 2002///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/4648
ER  -