TY  - BOOK
AU  - Tan, Jiubin, ed.
TI  - Tenth International Symposium on Precision Engineering Measurements and Instrumentation
T2  - Proceedings of SPIE; V. 11053
SN  - 9781510627819 (Print)
PY  - 2019///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/11053
ER  -