TY  - BOOK
AU  - Murrer, R. Lee, ed.
TI  - Technologies for Synthetic Environments: Hardware-in-the-Loop Testing X
T2  - Proceedings of SPIE; V. 5785
SN  - 9780819457707 (Print)
PY  - 2005///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/5785
ER  -