TY  - BOOK
AU  - Murrer, R. Lee, ed.
TI  - Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VII
T2  - Proceedings of SPIE; V. 4717
SN  - 9780819444677 (Print)
PY  - 2002///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/4717
ER  -