TY  - BOOK
AU  - Murrer, R. Lee, ed.
TI  - Technologies for Synthetic Environments: Hardware-in-the-Loop Testing III
T2  - Proceedings of SPIE; V. 3368
SN  - 9780819428172 (Print)
PY  - 1998///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/3368
ER  -