Murrer, R. Lee, ed. <br/><br/>
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing III  [eBook] 

 - Washington, USA  SPIE  1998 
 - Online resource 
 - Proceedings of SPIE; V. 3368 .
<br/><br/><label>ISBN: </label>9780819428172 (Print)