TY  - BOOK
AU  - Greivenkamp, John, ed.
TI  - Surface Characterization and Testing II
T2  - Proceedings of SPIE; V. 1164
SN  - 9780819402004 (Print)
PY  - 1989///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/1164
ER  -