TY  - BOOK
AU  - Shahriar, Selim, ed.
TI  - Steep Dispersion Engineering and Opto-Atomic Precision Metrology XI
T2  - Proceedings of SPIE; V. 10548
SN  - 9781510615816 (Print)
PY  - 2018///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/10548
ER  -