TY  - BOOK
AU  - Shahriar, Selim, ed.
TI  - Slow Light, Fast Light, and Opto-Atomic Precision Metrology X
T2  - Proceedings of SPIE; V. 10119
SN  - 9781510606791 (Print)
PY  - 2017///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/10119
ER  -