TY  - BOOK
AU  - Tan, Jiubin, ed.
TI  - Sixth International Symposium on Precision Engineering Measurements and Instrumentation
T2  - Proceedings of SPIE; V. 7544
SN  - 9780819479402 (Print)
PY  - 2010///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/7544
ER  -