TY  - BOOK
AU  - Chugui, Yuri, ed.
TI  - Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life
T2  - Proceedings of SPIE; V. 4900
SN  - 9780819446862 (Print)
PY  - 2002///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/4900
ER  -