Chugui, Yuri, ed. <br/><br/>
Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life  [eBook] 

 - Washington, USA  SPIE  2002 
 - Online resource 
 - Proceedings of SPIE; V. 4900 .
<br/><br/><label>ISBN: </label>9780819446862 (Print)