Tian, Yangchao, ed. <br/><br/>
Second Symposium on Novel Technology of X-Ray Imaging  [eBook] 

 - Washington, USA  SPIE  2019 
 - Online resource 
 - Proceedings of SPIE; V. 11068 .
<br/><br/><label>ISBN: </label>9781510628267 (Print) 9781510628274 (Online)