TY  - BOOK
AU  - Chiang, Fu-Pen, ed.
TI  - Second International Conference on Photomechanics and Speckle Metrology
T2  - Proceedings of SPIE; V. 1554
SN  - 9780819406828 (Print)
PY  - 1991///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/1554
ER  -