TY  - BOOK
AU  - Gu, Zu-Han, ed.
TI  - Scattering and Surface Roughness II
T2  - Proceedings of SPIE; V. 3426
SN  - 9780819428813 (Print)
PY  - 1998///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/3426
ER  -