Postek, Michael, ed. <br/><br/>
Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences  [eBook] 

 - Washington, USA  SPIE  2013 
 - Online resource 
 - Proceedings of SPIE; V. 8729 .
<br/><br/><label>ISBN: </label>9780819495204 (Print)