TY  - BOOK
AU  - Postek, Michael, ed.
TI  - Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
T2  - Proceedings of SPIE; V. 8378
SN  - 9780819490568 (Print)
PY  - 2012///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/8378
ER  -