TY  - BOOK
AU  - Postek, Michael, ed.
TI  - Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
T2  - Proceedings of SPIE; V. 8036
SN  - 9780819486103 (Print)
PY  - 2011///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/8036
ER  -