Postek, Michael, ed. <br/><br/>
Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences  [eBook] 

 - Washington, USA  SPIE  2011 
 - Online resource 
 - Proceedings of SPIE; V. 8036 .
<br/><br/><label>ISBN: </label>9780819486103 (Print)