TY  - BOOK
AU  - Chen, Philip, ed.
TI  - Rough Surface Scattering and Contamination
T2  - Proceedings of SPIE; V. 3784
SN  - 9780819432704 (Print)
PY  - 1999///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/3784
ER  -