TY  - BOOK
AU  - Hartzell, Allyson, ed.
TI  - Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VII
T2  - Proceedings of SPIE; V. 6884
SN  - 9780819470591 (Print)
PY  - 2008///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/6884
ER  -