00788nam a2200181Ia 4500003000900000008004100009020002600050040001600076100003200092245010600124260003200230300002000262490003300282856010300315942000700418999001700425952016400442IN-BaIIA211028s9999    xx      s     000 0 eng d  a9780819432926 (Print)  cIIA Library  aPodio, Fernando, ed.947428 0aRecent Advances in Metrology, Characterization, and Standards for Optical Digital Data Disksh[eBook]  aWashington, USAbSPIEc1999  aOnline resource  aProceedings of SPIE; V. 3806  uhttps://www.spiedigitallibrary.org/conference-proceedings-of-spie/3806yClick Here to Access eBook  cEB  c31623d31623  00104070aBANbBANd2011-07-01eSPIEhV. 3806l0pEB11083r2021-11-05uhttps://www.spiedigitallibrary.org/conference-proceedings-of-spie/3806w2021-11-05yEB