TY  - BOOK
AU  - Podio, Fernando, ed.
TI  - Recent Advances in Metrology, Characterization, and Standards for Optical Digital Data Disks
T2  - Proceedings of SPIE; V. 3806
SN  - 9780819432926 (Print)
PY  - 1999///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/3806
ER  -