00557nam a2200145Ia 4500003000900000008004100009020002600050040001600076100002500092245010600117260003200223300002000255490003300275856010300308IN-BaIIA211028s9999    xx      s     000 0 eng d  a9780819432926 (Print)  cIIA Library  aPodio, Fernando, ed. 0aRecent Advances in Metrology, Characterization, and Standards for Optical Digital Data Disksh[eBook]  aWashington, USAbSPIEc1999  aOnline resource  aProceedings of SPIE; V. 3806  uhttps://www.spiedigitallibrary.org/conference-proceedings-of-spie/3806yClick Here to Access eBook