Podio, Fernando, ed. <br/><br/>
Recent Advances in Metrology, Characterization, and Standards for Optical Digital Data Disks  [eBook] 

 - Washington, USA  SPIE  1999 
 - Online resource 
 - Proceedings of SPIE; V. 3806 .
<br/><br/><label>ISBN: </label>9780819432926 (Print)