TY  - BOOK
AU  - Chiang, Fu-Pen, ed.
TI  - Photomechanics and Speckle Metrology
T2  - Proceedings of SPIE; V. 0814
SN  - 9780892528493 (Print)
PY  - 1987///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/0814
ER  -