TY  - BOOK
AU  - Shearer, Andrew, ed.
TI  - Opto-Ireland 2002: Optical Metrology, Imaging, and Machine Vision
T2  - Proceedings of SPIE; V. 4877
SN  - 9780819446589 (Print)
PY  - 2003///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/4877
ER  -