Shearer, Andrew, ed. <br/><br/>
Opto-Ireland 2002: Optical Metrology, Imaging, and Machine Vision  [eBook] 

 - Washington, USA  SPIE  2003 
 - Online resource 
 - Proceedings of SPIE; V. 4877 .
<br/><br/><label>ISBN: </label>9780819446589 (Print)