Shahriar, Selim, ed. <br/><br/>
Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II  [eBook] 

 - Washington, USA  SPIE  2020 
 - Online resource 
 - Proceedings of SPIE; V. 11296 .
<br/><br/><label>ISBN: </label>9781510633551 (Print) 9781510633568 (Online)